Dr. Hamed Alemansour

 


Journal Articles

H. Alemansour; S. O. R. Moheimani; J. H. G. Owen; J. N. Randall; E. Fuchs

An ultra-fast method for scanning tunneling spectroscopy Journal Article

In: Journal of Vacuum Science & Technology B , vol. 39, no. 4, 2021.

BibTeX | Links:

H. Alemansour; S. O. R. Moheimani; J. H. G. Owen; E. Fuchs; J. N. Randall

High signal-to-noise ratio differential conductance spectroscopy Journal Article

In: Journal of Vacuum Science & Technology B , vol. 39, no. 1, pp. 010601 (5pp), 2021.

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H. Alemansour; S. O. R. Moheimani; J. H. G. Owen; J. N. Randall; E. Fuchs

Controlled removal of hydrogen atoms from H-terminated silicon surfaces Journal Article

In: Journal of Vacuum Science & Technology B , vol. 38, no. 4, pp. 040601, 2020.

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M. Maroufi; H. Alemansour; S. O. R. Moheimani

A High Dynamic Range Closed-Loop Stiffness-Adjustable MEMS Force Sensor Journal Article

In: IEEE Journal of Microelectromechanical Systems, vol. 29, no. 3, pp. 397 - 407, 2020.

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M. B. Coskun; H. Alemansour; A. G. Fowler; M. Maroufi; S. O. R. Moheimani

Q Control of an Active AFM CantileverWith Differential Sensing Configuration Journal Article

In: IEEE Transactions on Control Systems Technology, vol. 27, no. 5, pp. 2271 - 2278, 2019.

BibTeX | Links:

M. Maroufi; H. Alemansour; M. B. Coskun; S. O. R. Moheimani

An Adjustable-stiffness MEMS Force Sensor: Design, Characterization, and Control Journal Article

In: Mechatronics, vol. 56, pp. 198–210, 2018.

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Inproceedings

S. O. R. Moheimani; H. Alemansour

A new approach to removing H atoms in hydrogen depassivation lithography Inproceedings

In: SPIE Conference on Novel Patterning Technologies for Semiconductors, MEMS/NEMS and MOEMS 2020, pp. 113240Y, 2020.

BibTeX

H. Alemansour; M. Maroufi; A. Alipour; S. O. R. Moheimani

A Feedback Controlled MEMS Probe Scanner for On-Chip AFM Inproceedings

In: 8th IFAC Symposium on Mechatronic Systems, Vienna, Austria, 2019.

BibTeX

M. Maroufi; A. Alipour; H. Alemansour; S. O. R. Moheimani

Design and Characterization of a MEMS Probe Scanner for On-chip Atomic Force Microscopy Inproceedings

In: International Conference on Manipulation Automation and Robotics at Small Scales, Helsinki, Finland, 2019.

BibTeX | Links:

M. Maroufi; H. Alemansour; S. O. R. Moheimani

A Closed-Loop MEMS Force Sensor with Adjustable Stiffness Inproceedings

In: IEEE Conference on Control Technology and Applications, Hawaii, USA, 2017.

BibTeX