Journal Articles
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| F. Tajaddodianfar; S. O. R. Moheimani; J. N. Randall Scanning Tunneling Microscope Control: A Self-Tuning PI Controller Based on Online Local Barrier Height Estimation Journal Article IEEE Transactions on Control Systems Technology, 27 (5), pp. 2004 - 2015, 2019. BibTeX | Links:   @article{J19b,
title = {Scanning Tunneling Microscope Control: A Self-Tuning PI Controller Based on Online Local Barrier Height Estimation},
author = {F. Tajaddodianfar and S. O. R. Moheimani and J. N. Randall},
url = {http://ldcn-mechatronics.net/lab/wp-content/uploads/08399525-1.pdf},
doi = {10.1109/TCST.2018.2844781},
year = {2019},
date = {2019-09-01},
journal = {IEEE Transactions on Control Systems Technology},
volume = {27},
number = {5},
pages = {2004 - 2015},
keywords = {},
pubstate = {published},
tppubtype = {article}
}
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| F. Tajaddodianfar; S. O. R. Moheimani; J. Owen; J. N. Randall On the effect of local barrier height in scanning tunneling microscopy: Measurement methods and control implications Journal Article Review of Scientific Instruments, 89 (1), pp. 013701, 2018. BibTeX | Links: @article{J18b,
title = {On the effect of local barrier height in scanning tunneling microscopy: Measurement methods and control implications},
author = {F. Tajaddodianfar and S. O. R. Moheimani and J. Owen and J. N. Randall},
url = {http://ldcn-mechatronics.net/lab/wp-content/uploads/RSI_farid-1.pdf},
year = {2018},
date = {2018-01-02},
journal = {Review of Scientific Instruments},
volume = {89},
number = {1},
pages = {013701},
keywords = {},
pubstate = {published},
tppubtype = {article}
}
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Inproceedings
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| F. Tajaddodianfar; S. O. R. Moheimani; J. Owen; J. N. Randall A Self-Tuning Controller for High-Performance Scanning Tunneling Microscopy Inproceedings IEEE Conference on Control Technology and Applications, Hawaii, USA, 2017. BibTeX @inproceedings{C17f,
title = {A Self-Tuning Controller for High-Performance Scanning Tunneling Microscopy},
author = {F. Tajaddodianfar and S. O. R. Moheimani and J. Owen and J. N. Randall },
year = {2017},
date = {2017-08-28},
booktitle = {IEEE Conference on Control Technology and Applications},
address = {Hawaii, USA},
keywords = {},
pubstate = {published},
tppubtype = {inproceedings}
}
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| F. Tajaddodianfar; S. O. R. Moheimani; E. Fuchs; J. N. Randall Stability Analysis of a Scanning Tunneling Microscope Control System Inproceedings American Control Conference, Seattle, WA, USA, 2017. BibTeX @inproceedings{C17a,
title = {Stability Analysis of a Scanning Tunneling Microscope Control System},
author = {F. Tajaddodianfar and S. O. R. Moheimani and E. Fuchs and J. N. Randall},
year = {2017},
date = {2017-05-24},
booktitle = {American Control Conference},
address = {Seattle, WA, USA},
keywords = {},
pubstate = {published},
tppubtype = {inproceedings}
}
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| F. Tajaddodianfar; A. G. Fowler; S. O. R. Moheimani; E. Fuchs; J. N. Randall Frequency-Domain Closed-Loop System Identification of a Scanning Tunneling Microscope Inproceedings Proc. 2016 ASPE Spring Topical Meeting Precision Mechatronic System Design and Control, Boston, MA, 2016. BibTeX @inproceedings{C16d,
title = {Frequency-Domain Closed-Loop System Identification of a Scanning Tunneling Microscope},
author = {F. Tajaddodianfar and A. G. Fowler and S. O. R. Moheimani and E. Fuchs and J. N. Randall },
year = {2016},
date = {2016-04-20},
booktitle = {Proc. 2016 ASPE Spring Topical Meeting Precision Mechatronic System Design and Control},
address = {Boston, MA},
keywords = {},
pubstate = {published},
tppubtype = {inproceedings}
}
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Miscellaneous
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| F. Tajaddodianfar; S. O. R. Moheimani; J. Owen; J. Ballard; E. Fuchs; J. N. Randall Self-tuning PI Control for STM Tip ProtectionTaj Miscellaneous Presented at the 62nd International Conference on Electron, Ion and Photon Beam Technology \& Nanofabrication, Puerto Rico May 29 – June 1, 2018, 2018. BibTeX @misc{CA18a,
title = {Self-tuning PI Control for STM Tip ProtectionTaj},
author = {F. Tajaddodianfar and S. O. R. Moheimani and J. Owen and J. Ballard and E. Fuchs and J. N. Randall },
year = {2018},
date = {2018-05-29},
howpublished = {Presented at the 62nd International Conference on Electron, Ion and Photon Beam Technology \& Nanofabrication, Puerto Rico May 29 – June 1, 2018},
keywords = {},
pubstate = {published},
tppubtype = {misc}
}
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