Journal Articles
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| A. Alipour; E. Fowler; S. O. R. Moheimani; J. H. G. Owen; J. N. Randall Atom-resolved imaging with a silicon tip integrated into an on-chip scanning tunneling microscope Journal Article Review of Scientific Instruments, 95 (3), pp. 033703-7pp, 2024. BibTeX | Links:   @article{J24d,
title = {Atom-resolved imaging with a silicon tip integrated into an on-chip scanning tunneling microscope},
author = {A. Alipour and E. Fowler and S. O. R. Moheimani and J. H. G. Owen and J. N. Randall },
url = {https://ldcn-mechatronics.net/lab/wp-content/uploads/RSI23-AR-01854.pdf},
doi = {10.1063/5.0180777},
year = {2024},
date = {2024-03-27},
journal = {Review of Scientific Instruments},
volume = {95},
number = {3},
pages = {033703-7pp},
keywords = {},
pubstate = {published},
tppubtype = {article}
}
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| A. Alipour; E. Fowler; S. O. R. Moheimani; J. H. G. Owen; J. N. Randall Atomic-resolution lithography with an on-chip scanning tunneling microscope Journal Article Journal of Vacuum Science & Technology B , 40 , pp. 030603 (5pp), 2022. BibTeX | Links: @article{J22c,
title = {Atomic-resolution lithography with an on-chip scanning tunneling microscope},
author = {A. Alipour and E. Fowler and S. O. R. Moheimani and J. H. G. Owen and J. N. Randall},
url = {http://ldcn-mechatronics.net/lab/wp-content/uploads/JVB22-LE-00050-1.pdf},
year = {2022},
date = {2022-04-25},
urldate = {2022-04-25},
journal = {Journal of Vacuum Science & Technology B },
volume = {40},
pages = {030603 (5pp)},
keywords = {},
pubstate = {published},
tppubtype = {article}
}
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Inproceedings
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| E. Fuchs; J. H. G. Owen; A. Alipour; E. Fowler; S. O. R. Moheimani; J. N. Randall Scalable digital atomic precision lithography Inproceedings Proc. SPIE Conference on Novel Patterning Technologies 2023, San Jose, CA, 2023. BibTeX @inproceedings{C23c,
title = {Scalable digital atomic precision lithography},
author = {E. Fuchs and J. H. G. Owen and A. Alipour and E. Fowler and S. O. R. Moheimani and J. N. Randall},
year = {2023},
date = {2023-04-30},
booktitle = {Proc. SPIE Conference on Novel Patterning Technologies 2023},
address = {San Jose, CA},
keywords = {},
pubstate = {published},
tppubtype = {inproceedings}
}
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