Journal Articles
Sensorless Implementation of a PPF Controller for Active Q Control of an AFM Microcantilever Journal Article
In: IEEE Transactions on Control Systems Technology, vol. 22, no. 6, pp. 2118–2126, 2014.
Sensorless Enhancement of an Atomic Force Microscope Micro-cantilever Quality Factor Using Piezoelectric Shunt Control Journal Article
In: Review of Scientific Instruments, vol. 84, no. 5, pp. 053706 (8pp), 2013.
Control Techniques for Increasing the Scan Speed and Minimizing Image Artifacts in Tapping Mode Atomic Force Microscopy: Toward Video-Rate Nanoscale Imaging Journal Article
In: IEEE Control Systems Magazine, vol. 33, no. 6, pp. 46–67, 2013.
A Switched Gain Resonant Controller to Minimize Image Artifacts in Intermittent Contact Mode Atomic Force Microscopy Journal Article
In: IEEE Transactions on Nanotechnology, vol. 11, no. 6, pp. 1126–1134, 2012, (DOI: 10.1109/TNANO.2012.2216288).
Resonant Control of an Atomic Force Microscope Micro-cantilever for Active Q Control Journal Article
In: Review of Scientific Instruments, vol. 83, no. 8, pp. 083708 (9pp), 2012.
Q-Control of an Atomic Force Microscope Micro-cantilever: A Sensor-less Approach Journal Article
In: IEEE/ASME Journal of Microelectromechanical Systems, vol. 20, no. 6, pp. 1372 - 1381, 2011.
Inproceedings
Sensorless Damping Control of a High Speed Flexure Guided Nanopositioner Inproceedings
In: Proc. 19th IFAC World Congress, Cape Town, South Africa, 2014.
Active Piezoelectric Shunt Control of an Atomic Force Microscope Micro-Cantilever Inproceedings
In: Proc. Australian Control Conference, Perth, Australia, 2013.
Multi-Mode Resonant Control of a Micro-Cantilever for Atomic Force Microscopy Inproceedings
In: Proc. IEEE/ASME International Conference on Advanced Intelligent Mechatronics, Wollongong, Australia, 2013.
A New Approach to Active Q Control of an Atomic Force Microscope Micro-cantilever Operating in Tapping Mode Inproceedings
In: Proc. 6th IFAC Symposium on Mechatronic Systems, Hangzhou, China, 2013.
Minimizing Probe Loss in Tapping Mode Atomic Force Microscopy Using a Switched Gain Resonant Controller Inproceedings
In: Proc. Australian Control Conference, Sydney, Australia, 2012.
Quality Factor Enhancement of an Atomic Force Microscope Micro-cantilever Using Piezoelectric Shunt Control Inproceedings
In: Proc. IEEE/ASME International Conference on Advanced Intelligent Mechatronics, Kaosiung, Taiwan, 2012.
Improving the Scan Rate and Image Quality in Tapping Mode Atomic Force Microscopy with Piezoelectric Shunt Control Inproceedings
In: Proc. Australian Control Conference, pp. 26–31, Melbourne, Australia, 2011.
Passive Piezoelectric Shunt Control of an Atomic Force Microscope Microcantilever Inproceedings
In: Proc. IEEE/ASME International Conference on Advanced Intelligent Mechatronics, pp. 634–639, Budapest, Hungary, 2011.