Afshin Alipour received B.Sc. in mechanical engineering from the Amirkabir University of Technology, Tehran, Iran, in 2013. He pursued his M.Sc. in applied mechanics at the University of Tehran, Tehran, Iran. During his studies, he focused on fields of dynamics, control, vibrations and mechatronics which are his main interests. He worked on design, fabrication and control of a new robotic system for lower limb rehabilitation as his master thesis. He also worked on analytically evaluating non-linear behavior of beams in micro/nano scales. After graduating from the University of Tehran in 2016, he started his Ph.D. in mechanical engineering at the University of Texas at Dallas in 2017.
Atomic-resolution lithography with an on-chip scanning tunneling microscope Journal Article
In: Journal of Vacuum Science & Technology B , vol. 40, pp. 030603 (5pp), 2022.
Atomic precision imaging with an on-chip STM integrated into a commercial UHV STM system Journal Article
In: Journal of Vacuum Science & Technology B , vol. 39, no. 4, 2021.
A MEMS nanopositioner with integrated tip for scanning tunneling microscopy Journal Article
In: IEEE Journal of Microelectromechanical Systems , vol. 30, no. 2 , pp. 271 – 280, 2021.
Video-Rate Non-Raster AFM Imaging with Cycloid Trajectory Journal Article
In: IEEE Transactions on Control Systems Technology, vol. 28, no. 21, pp. 436 - 447, 2020.
A High Bandwidth Microelectromechanical System-Based Nanopositioner for Scanning Tunneling Microscopy Journal Article
In: Review of Scientific Instruments, vol. 90, no. 7, pp. 073706, 2019.
DESIGN, FABRICATION AND CHARACTERIZATION OF ACTIVE ATOMIC FORCE MICROSCOPE CANTILEVER ARRAYS Inproceedings
In: The 34th International Conference on Micro Electro Mechanical Systems (IEEE MEMS 2021), 2021.
A Feedback Controlled MEMS Probe Scanner for On-Chip AFM Inproceedings
In: 8th IFAC Symposium on Mechatronic Systems, Vienna, Austria, 2019.
Design, Fabrication, and Characterization of a Piezoelectric AFM Cantilever Array Inproceedings
In: 2019 IEEE Conference on Control Technology and Applications (CCTA), Hong Kong, China, 2019.
Design and Characterization of a MEMS Probe Scanner for On-chip Atomic Force Microscopy Inproceedings
In: International Conference on Manipulation Automation and Robotics at Small Scales, Helsinki, Finland, 2019.
Sequential Cycloid Scanning for Time-Resolved Atomic Force Microscopy Inproceedings
In: IEEE/ASME International Conference on Advanced Intelligent Mechatronics, AIM2018, Auckland, New Zealand, 2018.
Internal Model Control of Cycloid Trajectory for Video-Rate AFM Imaging with a SOI-MEMS Nanopositioner Inproceedings
In: AMERICAN CONTROL CONFERENCE, Milwaukee, Wisconsin, 2018.