Journal Articles
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| A. Alipour; E. Fowler; S. O. R. Moheimani; J. H. G. Owen; J. N. Randall Atom-resolved imaging with a silicon tip integrated into an on-chip scanning tunneling microscope Journal Article Review of Scientific Instruments, 95 (3), pp. 033703-7pp, 2024. BibTeX | Links:   @article{J24d,
title = {Atom-resolved imaging with a silicon tip integrated into an on-chip scanning tunneling microscope},
author = {A. Alipour and E. Fowler and S. O. R. Moheimani and J. H. G. Owen and J. N. Randall },
url = {https://ldcn-mechatronics.net/lab/wp-content/uploads/RSI23-AR-01854.pdf},
doi = {10.1063/5.0180777},
year = {2024},
date = {2024-03-27},
journal = {Review of Scientific Instruments},
volume = {95},
number = {3},
pages = {033703-7pp},
keywords = {},
pubstate = {published},
tppubtype = {article}
}
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| A. Alipour; E. Fowler; S. O. R. Moheimani; J. H. G. Owen; J. N. Randall Atomic-resolution lithography with an on-chip scanning tunneling microscope Journal Article Journal of Vacuum Science & Technology B , 40 , pp. 030603 (5pp), 2022. BibTeX | Links: @article{J22c,
title = {Atomic-resolution lithography with an on-chip scanning tunneling microscope},
author = {A. Alipour and E. Fowler and S. O. R. Moheimani and J. H. G. Owen and J. N. Randall},
url = {http://ldcn-mechatronics.net/lab/wp-content/uploads/JVB22-LE-00050-1.pdf},
year = {2022},
date = {2022-04-25},
urldate = {2022-04-25},
journal = {Journal of Vacuum Science & Technology B },
volume = {40},
pages = {030603 (5pp)},
keywords = {},
pubstate = {published},
tppubtype = {article}
}
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| A. Alipour; S. O. R. Moheimani; J. H. G. Owen; E. Fuchs; J. N. Randall Atomic precision imaging with an on-chip STM integrated into a commercial UHV STM system Journal Article Journal of Vacuum Science & Technology B , 39 (4), 2021. BibTeX | Links: @article{J21g,
title = {Atomic precision imaging with an on-chip STM integrated into a commercial UHV STM system},
author = {A. Alipour and S. O. R. Moheimani and J. H. G. Owen and E. Fuchs and J. N. Randall },
url = {http://ldcn-mechatronics.net/lab/wp-content/uploads/JVB21-LE-00096.pdf},
doi = {10.1116/6.0001107},
year = {2021},
date = {2021-06-25},
journal = {Journal of Vacuum Science & Technology B },
volume = {39},
number = {4},
keywords = {},
pubstate = {published},
tppubtype = {article}
}
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| A. Alipour; M. B. Coskun; S. O. R. Moheimani A MEMS nanopositioner with integrated tip for scanning tunneling microscopy Journal Article IEEE Journal of Microelectromechanical Systems , 30 (2 ), pp. 271 – 280, 2021. BibTeX | Links: @article{J21c,
title = {A MEMS nanopositioner with integrated tip for scanning tunneling microscopy},
author = {A. Alipour and M. B. Coskun and S. O. R. Moheimani},
url = {http://ldcn-mechatronics.net/lab/wp-content/uploads/A_MEMS_Nanopositioner_With_Integrated_Tip_for_Scanning_Tunneling_Microscopy.pdf},
doi = {10.1109/JMEMS.2021.3052180},
year = {2021},
date = {2021-04-01},
journal = {IEEE Journal of Microelectromechanical Systems },
volume = {30},
number = {2 },
pages = {271 -- 280},
keywords = {},
pubstate = {published},
tppubtype = {article}
}
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| N. Nikooienejad; A. Alipour; M. Maroufi; S. O. R. Moheimani Video-Rate Non-Raster AFM Imaging with Cycloid Trajectory Journal Article IEEE Transactions on Control Systems Technology, 28 (21), pp. 436 - 447, 2020. BibTeX | Links: @article{J20b,
title = {Video-Rate Non-Raster AFM Imaging with Cycloid Trajectory},
author = {N. Nikooienejad and A. Alipour and M. Maroufi and S. O. R. Moheimani },
url = {http://ldcn-mechatronics.net/lab/wp-content/uploads/08575120.pdf},
doi = {10.1109/TCST.2018.2879939},
year = {2020},
date = {2020-01-01},
journal = {IEEE Transactions on Control Systems Technology},
volume = {28},
number = {21},
pages = {436 - 447},
keywords = {},
pubstate = {published},
tppubtype = {article}
}
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| A. Alipour; M. B. Coskun; S. O. R. Moheimani A High Bandwidth Microelectromechanical System-Based Nanopositioner for Scanning Tunneling Microscopy Journal Article Review of Scientific Instruments, 90 (7), pp. 073706, 2019. BibTeX | Links: @article{J19e,
title = {A High Bandwidth Microelectromechanical System-Based Nanopositioner for Scanning Tunneling Microscopy},
author = {A. Alipour and M. B. Coskun and S. O. R. Moheimani },
doi = {doi:10.1063/1.5109900},
year = {2019},
date = {2019-07-31},
journal = {Review of Scientific Instruments},
volume = {90},
number = {7},
pages = {073706},
keywords = {},
pubstate = {published},
tppubtype = {article}
}
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Inproceedings
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| E. Fuchs; J. H. G. Owen; A. Alipour; E. Fowler; S. O. R. Moheimani; J. N. Randall Scalable digital atomic precision lithography Inproceedings Proc. SPIE Conference on Novel Patterning Technologies 2023, San Jose, CA, 2023. BibTeX @inproceedings{C23c,
title = {Scalable digital atomic precision lithography},
author = {E. Fuchs and J. H. G. Owen and A. Alipour and E. Fowler and S. O. R. Moheimani and J. N. Randall},
year = {2023},
date = {2023-04-30},
booktitle = {Proc. SPIE Conference on Novel Patterning Technologies 2023},
address = {San Jose, CA},
keywords = {},
pubstate = {published},
tppubtype = {inproceedings}
}
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| M. Soleymaniha; M. B. Coskun; H. M. Nasrabadi; A. Alipour; S. O. R. Moheimani DESIGN, FABRICATION AND CHARACTERIZATION OF ACTIVE ATOMIC FORCE MICROSCOPE CANTILEVER ARRAYS Inproceedings The 34th International Conference on Micro Electro Mechanical Systems (IEEE MEMS 2021), 2021. BibTeX @inproceedings{C21a,
title = {DESIGN, FABRICATION AND CHARACTERIZATION OF ACTIVE ATOMIC FORCE MICROSCOPE CANTILEVER ARRAYS},
author = {M. Soleymaniha and M. B. Coskun and H. M. Nasrabadi and A. Alipour and S. O. R. Moheimani },
year = {2021},
date = {2021-01-25},
booktitle = {The 34th International Conference on Micro Electro Mechanical Systems (IEEE MEMS 2021)},
keywords = {},
pubstate = {published},
tppubtype = {inproceedings}
}
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| H. Alemansour; M. Maroufi; A. Alipour; S. O. R. Moheimani A Feedback Controlled MEMS Probe Scanner for On-Chip AFM Inproceedings 8th IFAC Symposium on Mechatronic Systems, Vienna, Austria, 2019. BibTeX @inproceedings{C19c,
title = {A Feedback Controlled MEMS Probe Scanner for On-Chip AFM},
author = {H. Alemansour and M. Maroufi and A. Alipour and S. O. R. Moheimani},
year = {2019},
date = {2019-09-04},
booktitle = {8th IFAC Symposium on Mechatronic Systems},
address = {Vienna, Austria},
keywords = {},
pubstate = {published},
tppubtype = {inproceedings}
}
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| M. B. Coskun; M. Baan; A. Alipour; S. O. R. Moheimani Design, Fabrication, and Characterization of a Piezoelectric AFM Cantilever Array Inproceedings 2019 IEEE Conference on Control Technology and Applications (CCTA), Hong Kong, China, 2019. BibTeX | Links: @inproceedings{C19d,
title = {Design, Fabrication, and Characterization of a Piezoelectric AFM Cantilever Array},
author = {M. B. Coskun and M. Baan and A. Alipour and S. O. R. Moheimani },
doi = {10.1109/CCTA.2019.8920686},
year = {2019},
date = {2019-08-19},
booktitle = {2019 IEEE Conference on Control Technology and Applications (CCTA)},
address = {Hong Kong, China},
keywords = {},
pubstate = {published},
tppubtype = {inproceedings}
}
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| M. Maroufi; A. Alipour; H. Alemansour; S. O. R. Moheimani Design and Characterization of a MEMS Probe Scanner for On-chip Atomic Force Microscopy Inproceedings International Conference on Manipulation Automation and Robotics at Small Scales, Helsinki, Finland, 2019. BibTeX | Links: @inproceedings{C19a,
title = {Design and Characterization of a MEMS Probe Scanner for On-chip Atomic Force Microscopy},
author = {M. Maroufi and A. Alipour and H. Alemansour and S. O. R. Moheimani },
doi = {10.1109/MARSS.2019.8860968},
year = {2019},
date = {2019-07-01},
booktitle = {International Conference on Manipulation Automation and Robotics at Small Scales},
address = {Helsinki, Finland},
keywords = {},
pubstate = {published},
tppubtype = {inproceedings}
}
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| N. Nikooienejad; A. Alipour; M. Maroufi; S. O. R. Moheimani Sequential Cycloid Scanning for Time-Resolved Atomic Force Microscopy Inproceedings IEEE/ASME International Conference on Advanced Intelligent Mechatronics, AIM2018, Auckland, New Zealand, 2018. BibTeX @inproceedings{C18b,
title = {Sequential Cycloid Scanning for Time-Resolved Atomic Force Microscopy},
author = {N. Nikooienejad and A. Alipour and M. Maroufi and S. O. R. Moheimani },
year = {2018},
date = {2018-07-09},
booktitle = {IEEE/ASME International Conference on Advanced Intelligent Mechatronics, AIM2018},
address = {Auckland, New Zealand},
keywords = {},
pubstate = {published},
tppubtype = {inproceedings}
}
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| A. Alipour; N. Nikooienejad; M. Maroufi; S. O. R. Moheimani Internal Model Control of Cycloid Trajectory for Video-Rate AFM Imaging with a SOI-MEMS Nanopositioner Inproceedings AMERICAN CONTROL CONFERENCE, Milwaukee, Wisconsin, 2018. BibTeX @inproceedings{C18c,
title = {Internal Model Control of Cycloid Trajectory for Video-Rate AFM Imaging with a SOI-MEMS Nanopositioner},
author = {A. Alipour and N. Nikooienejad and M. Maroufi and S. O. R. Moheimani},
year = {2018},
date = {2018-06-27},
booktitle = {AMERICAN CONTROL CONFERENCE},
address = {Milwaukee, Wisconsin},
keywords = {},
pubstate = {published},
tppubtype = {inproceedings}
}
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