M. B. Coskun, H. Alemansour, A. G. Fowler, M. Maroufi, S. O. R. Moheimani Q Control of an Active AFM CantileverWith Differential Sensing Configuration (Journal Article) IEEE Transactions on Control Systems Technology, 27 (5), pp. 2271 - 2278, 2019. (BibTeX | Links:   ) @article{J19c,
title = {Q Control of an Active AFM CantileverWith Differential Sensing Configuration},
author = {M. B. Coskun and H. Alemansour and A. G. Fowler and M. Maroufi and S. O. R. Moheimani},
url = {http://ldcn-mechatronics.net/lab/wp-content/uploads/08410617.pdf},
doi = {10.1109/TCST.2018.2850338},
year = {2019},
date = {2019-09-01},
journal = {IEEE Transactions on Control Systems Technology},
volume = {27},
number = {5},
pages = { 2271 - 2278},
keywords = {},
pubstate = {published},
tppubtype = {article}
}
|
F. Tajaddodianfar, S. O. R. Moheimani, J. N. Randall Scanning Tunneling Microscope Control: A Self-Tuning PI Controller Based on Online Local Barrier Height Estimation (Journal Article) IEEE Transactions on Control Systems Technology, 27 (5), pp. 2004 - 2015, 2019. (BibTeX | Links: ) @article{J19b,
title = {Scanning Tunneling Microscope Control: A Self-Tuning PI Controller Based on Online Local Barrier Height Estimation},
author = {F. Tajaddodianfar and S. O. R. Moheimani and J. N. Randall},
url = {http://ldcn-mechatronics.net/lab/wp-content/uploads/08399525-1.pdf},
doi = {10.1109/TCST.2018.2844781},
year = {2019},
date = {2019-09-01},
journal = {IEEE Transactions on Control Systems Technology},
volume = {27},
number = {5},
pages = {2004 - 2015},
keywords = {},
pubstate = {published},
tppubtype = {article}
}
|
N. Nikooienejad, M. Maroufi, S. O. R. Moheimani Rosette-scan video-rate atomic force microscopy: Trajectory patterning and control design (Journal Article) Review of Scientific Instruments, 90 , pp. 073702 (10pp), 2019. (BibTeX | Links: ) @article{J19d,
title = {Rosette-scan video-rate atomic force microscopy: Trajectory patterning and control design},
author = {N. Nikooienejad and M. Maroufi and S. O. R. Moheimani},
url = {http://ldcn-mechatronics.net/lab/wp-content/uploads/1.5098499.pdf},
doi = {10.1063/1.5098499},
year = {2019},
date = {2019-07-10},
journal = {Review of Scientific Instruments},
volume = {90},
pages = {073702 (10pp)},
keywords = {},
pubstate = {published},
tppubtype = {article}
}
|
A. Bazaei, Z. Chen, Y. K. Yong, S. O. R. Moheimani A novel state transformation approach to tracking of piecewise linear trajectories (Journal Article) IEEE Transactions on Control Systems Technology, 26 (1), pp. 128–138, 2018. (BibTeX | Links: ) @article{J18a,
title = {A novel state transformation approach to tracking of piecewise linear trajectories},
author = {A. Bazaei and Z. Chen and Y. K. Yong and S. O. R. Moheimani},
url = {http://ldcn-mechatronics.net/lab/wp-content/uploads/07851084.pdf},
year = {2018},
date = {2018-01-19},
journal = {IEEE Transactions on Control Systems Technology},
volume = {26},
number = {1},
pages = {128--138},
keywords = {},
pubstate = {published},
tppubtype = {article}
}
|
F. Tajaddodianfar, S. O. R. Moheimani, J. Owen, J. N. Randall On the effect of local barrier height in scanning tunneling microscopy: Measurement methods and control implications (Journal Article) Review of Scientific Instruments, 89 (1), pp. 013701, 2018. (BibTeX | Links: ) @article{J18b,
title = {On the effect of local barrier height in scanning tunneling microscopy: Measurement methods and control implications},
author = {F. Tajaddodianfar and S. O. R. Moheimani and J. Owen and J. N. Randall},
url = {http://ldcn-mechatronics.net/lab/wp-content/uploads/RSI_farid-1.pdf},
year = {2018},
date = {2018-01-02},
journal = {Review of Scientific Instruments},
volume = {89},
number = {1},
pages = {013701},
keywords = {},
pubstate = {published},
tppubtype = {article}
}
|
M. G. Ruppert, A. G. Fowler, M. Maroufi, S. O. R. Moheimani On-Chip Dynamic Mode Atomic Force Microscopy: A Silicon-on-Insulator MEMS Approach (Journal Article) IEEE Journal of Microelectromechanical Systems, 26 (1), pp. 215 - 225, 2017. (BibTeX | Links: ) @article{J17a,
title = {On-Chip Dynamic Mode Atomic Force Microscopy: A Silicon-on-Insulator MEMS Approach},
author = {M. G. Ruppert and A. G. Fowler and M. Maroufi and S. O. R. Moheimani },
url = {http://ldcn-mechatronics.net/lab/wp-content/uploads/07775031-2.pdf},
doi = {10.1109/JMEMS.2016.2628890},
year = {2017},
date = {2017-02-01},
journal = {IEEE Journal of Microelectromechanical Systems},
volume = {26},
number = {1},
pages = {215 - 225},
keywords = {},
pubstate = {published},
tppubtype = {article}
}
|
