LDCN receives Phase-I STTR funding from Department of Energy

Reza Moheimani and James Owen (Zyvex Labs) have won a Department of Energy (DOE) Phase-I Small Business Technology Transfer (STTR) award. The project “High Speed Platform for Highly Parallel STM lithography and Hierarchical Assembly” aims to develop and commercialize Microelectromechanical System (MEMS)-based Scanning Tunneling Microscope (STM) scanners.

LDCN receives DOE funding under EERE’s Emerging Research Exploration program

The project, “A Platform Technology for High-throughput Atomically Precise Manufacturing: Mechatronics at the Atomic Scale”, was selected earlier this year as one of the 24 proposals to be funded under this program by DOE-EERE Advanced Manufacturing Office. The project is led by Moheimani and involves Zyvex Labs (John Randall) and NIST (Jason Gorman) as subcontractors. More details can be found here.

Michael Ruppert received the best thesis award

Congratulations to Michael Ruppert for receiving University of Newcastle’s Award for Higher Degree by Research Excellence for his thesis titled: “Self-Sensing, Estimation and Control in Multifrequency Atomic Force Microscopy”

Professor Moheimani to present a plenary lecture at ACODS 2018

Professor Moheimani will be presenting a plenary lecture at ACODS 2018, IFAC International Conference on Advances in Control and Optimization of Dynamical Systems. The conference will be held on February 18-22, 2018 in Hyderabad, India. The talk will be concerned with the LDCN’s work on control system design for atomically precise manufacturing (APM).

LDCN’s on-chip AFM research featured in IEEE Spectrum

LDCN’s recent development of a silicon-on-insulator MEMS-based atomic force microscope has recently been featured in IEEE Spectrum in the article New Paradigm in Microscopy: Atomic Force Microscope on a Chip. The article highlights the group’s latest results from their ongoing research in on-chip atomic force microscopy, which has led to the development of a single-chip MEMS device designed for tapping-mode AFM that features an in-plane scanner and an integrated microcantilever with piezoelectric actuation and sensing. Further details about the on-chip AFM are reported in IEEE Journal of Microelectromechanical Systems.